Imaging | Cirrus Logic

Applications

From sensor input to digital output, engineered as one

Bring scanner-specific conditioning, conversion, LED drive, timing, and digital output together in one coordinated approach. Cirrus Logic imaging AFEs help teams simplify integration, manage heat near the sensor, and adapt the front end across scanner platforms.

Document & Production Scanning
Capture consistent image data in scanning systems designed for repeated high-throughput operation.
Industrial Inspection Imaging
Condition and convert sensor signals used to identify, record, or evaluate visual characteristics in industrial processes.
Measurement & Analysis Systems
Support imaging equipment that relies on stable sensor capture for downstream measurement or analysis.
Specialized CCD & CIS Platforms
Match analog front-end capabilities to application-specific sensor, channel, timing, and integration requirements.

Benefits

Superior imaging signal chain performance

Leverage sensor data effortlessly

Condition CCD and CIS signals before conversion, preparing data for the scanner’s downstream digital path.

Simplify repeatable capture

Coordinate sensor timing and channel capture to keep scan data aligned through the system architecture.

Build more into the front end

Combine conditioning, conversion, LED drive, and timing to simplify the front end for the scanner.

Efficient power budgets here to stay

Use a power-efficient SAR architecture to reduce conversion overhead and heat close to the sensor.

Product Spotlight

CS82L46 industrial imaging AFE

Six-channel imaging AFE designed for high-speed, low-power scanning, lower system complexity, and flexible deployment across document, flatbed, barcode, and industrial imaging systems.

See the product

Imaging Products

Designed for modern imaging needs

Capabilities that help you build a more efficient, scalable imaging solutions for your systems and applications.

CCD and CIS Sensor Support
Connect directly to CCD and CIS sensors, then condition and digitize pixel signals for scanner-class imaging architectures.
16-bit, 24 MSPS Conversion
Capture 16-bit pixel data at conversion rates up to 24 MSPS per channel for high-speed scanning.
Integrated Signal Conditioning
Shape sensor signals with reset-level clamping, correlated double sampling, programmable polarity, gain, and offset adjustment before conversion.

Integrated LED Control
Drive RGB and white LEDs with programmable current sinks and timing control to coordinate illumination with sensor capture.
Scalable Channel Architectures
Scale from one to six simultaneous channels to match your scanner architecture and support varying system requirements.
Flexible Digital Outputs
Choose CMOS or LVDS data paths to fit your controller, board, and digital transport requirements.

Compare imaging products

Product	Description	Status	Output Format	Control Interface	Speed (MSPS)	Resolution (bits)	Input PGA (bits)	Offset (bits)	Power Supply (V)	Power Consumption (mW)	LED Drive Resolution (bits)	Programmable Clamp Voltage (bits)	Target Market	Features	Package

CS82L46 Datasheet	High-performance Six-Channel AFE with Sensor Timing Generation and LVDS/CMOS Data Output	Active	LVDS 16/10-bit 5 pairs; LVDS 12-bit 4 pairs; LVDS 16/10-bit 3 pairs; LVDS 10-bit 2 pairs; CMOS (external timing) 16/10/8-bit; CMOS (internal TG timing) 12/10-bit	SPI or I²C	144	16	12	9	3.3	365	8	5			48 QFN-EP
WM8231 Datasheet	3-Channel High Speed CCD/CIS ADC	Active	LVDS 10-bit 5 pair, LVDS 16-bit 5 pair, CMOS 10-bit	Serial	105	16	12	8					Industrial	3-channel high speed CCD/CIS ADC	56 QFN
CS82L41 Datasheet	High performance 1-channel imaging Analog Front-End with CMOS Data Output	Active	CMOS 16/12/8 bit	SPI	24	16	12	9	3.3	47	8	5			28 QFN
CS82L44 Datasheet	High Performance Four-Channel AFE with Sensor Timing Generation and LVDS/CMOS Data Output	Active	LVDS 16/10-bit 3 pairs; LVDS 10-bit 2 pairs; CMOS (external timing) 16/8-bit; CMOS (internal TG timing) 12-bit	SPI or I²C	96	16	12	9	3.3	264	8	5			40 QFN-EP
WM8235 Datasheet	9-Channel High Speed CCD/CIS ADC	Active	LVDS 10/16 bit 5 pair\|LVDS 10/16 bit 3 pair\|LVDS 12 bit 4 pair\|CMOS 10 bit	Serial	210	16	12	8	2.97-3.63	1452				9-channel high speed CCD/CIS ADC with Sensor Timing generation and LVDS/CMOS Data output	56 QFN
WM8233	6-Channel High Speed CCD/CIS ADC	NRND	LVDS 10/16 bit 5 pair\|LVDS 10/16 bit 3 pair\|LVDS 12 bit 4 pair\|CMOS 10 bit	Serial	210	16	12	8	2.97-3.63	1287				6-channel high speed CCD/CIS ADC with Sensor Timing generation and LVDS/CMOS Data output	56 QFN

Support

Engineering expertise you can rely on

For more than 40 years, Cirrus Logic has partnered with engineering teams to solve demanding signal-chain challenges. Across industrial applications, measured data, practical evaluation tools, documented quality processes, and lifecycle support help teams progress from performance evaluation and integration through qualification and long-term production.

Confidence Beyond Launch
Support vehicle programs with proactive supply management and product lifecycles that typically span 10-plus years.
Quality you can plan around
Rely on documented reliability testing, ISO 9001-certified quality management, and ongoing product monitoring to support consistent performance throughout the product lifecycle.
Fabless production, built to scale
Bring products to market through trusted foundry partners, disciplined quality systems, and supply planning designed to support long-term demand.

Press Release
Cirrus Logic Introduces New Industrial Imaging Products for High-Precision Scan Applications
April 16, 2026
High performance, integrated analog front‑end ICs built for faster, more accurate commercial and industrial imaging

Imaging AFEs for Faster, More Efficient Scanning

From sensor input to digital output, engineered as one

Document & Production Scanning

Industrial Inspection Imaging

Measurement & Analysis Systems

Specialized CCD & CIS Platforms

Superior imaging signal chain performance

Leverage sensor data effortlessly

Simplify repeatable capture

Build more into the front end

Efficient power budgets here to stay

CS82L46 industrial imaging AFE

Designed for modern imaging needs

CCD and CIS Sensor Support

16-bit, 24 MSPS Conversion

Integrated Signal Conditioning

Integrated LED Control

Scalable Channel Architectures

Flexible Digital Outputs

Compare imaging products

Engineering expertise you can rely on

Imaging AFEs for Faster, More Efficient Scanning

From sensor input to digital output, engineered as one

Document & Production Scanning

Industrial Inspection Imaging

Measurement & Analysis Systems

Specialized CCD & CIS Platforms

Superior imaging signal chain performance

Leverage sensor data effortlessly

Simplify repeatable capture

Build more into the front end

Efficient power budgets here to stay

CS82L46 industrial imaging AFE

Designed for modern imaging needs

CCD and CIS Sensor Support

16-bit, 24 MSPS Conversion

Integrated Signal Conditioning

Integrated LED Control

Scalable Channel Architectures

Flexible Digital Outputs

Engineering expertise you can rely on